Showing 1–20 of 34 results
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BiLT Chassis (3)
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Heating Plates (2)
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Transistor Characterisation (2)
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AT211-1.5 – D-SUB 37 ways to 6 BNC cable
Our AT211-1.5 was developed specifically for our BE582 and BE5845. It makes it possible to offer 6 outputs on BNC connectors instead of a D-SUB connector. Its use saves time in setting up an experiment.
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BA2531 – Pulsed Voltage Source +120V +33A
The BA2531 is ideal for life testing and basic characterization of RF transistors. It allows a pulse between ground and a programmable level, and voltage and current measurements for both levels.
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BE2101 – Voltage Source: ±12V ±200mA, one output channel
Voltage Source: ±12V ±200mA, one output channel
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BE214x – Voltage Sources: ±12V ±15mA, 4 output channels
The BE214x voltage sources are high-end bipolar voltage sources developed for research applications requiring extremely low noise and/or high resolution and stability (quantum computing, nanotechnology, low-noise amplifiers, etc.). Co-created with the CNRS, the BE214x can be transformed into current sources to power, for example, superconducting magnets or any other components that drive current.
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BE2231 – Voltage Source: ±50V ±500mA, one output channel
Our BE2231 voltage source is designed to supply noise-sensitive components whatever the field of activity
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BE243x – Isolated Voltage Source +120V 5A
BE243x is a general purpose power supplies wich is also suitable for testing highly capacitive loads (e.g., pulsed transistor testing in conjunction with the BA2531).
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BE2501 – Pulsed Voltage Source ±25V ±200mA
The BE2501 is a low voltage and low current pulsed voltage source. It is well suited to drive the gate of a transistor.
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BE2800 & BE2801 – Current Source: ±6A 20V, one output channel
Very low-noise bipolar Magnet or Diode Power supply for the most demanding applications: particle accelerators, reliability test of laser diodes…
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BE2810 – Current Source: ±15A 15V, one output channel
Very low-noise bipolar Magnet or Diode Power supply for the most demanding applications: particle accelerators, reliability test of laser diodes…
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BE2811 – High Stability Current Source ±5A ±18V
The BE2811 module is a non-isolated high performance true current source designed to safely and reliably drive magnet loads up to 1H with excellent noise and stability performances. It is also perfectly suited to drive diodes in burn-in or characterization benches for instance.
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BE2850 – Current Source: ±2A 50V, one output channel
Very low-noise bipolar Magnet or Diode Power supply for the most demanding applications: particle accelerators, reliability test of diodes in series…
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BE2860 – Current Source: ±1.5A 3V, 4 output channels
Extremely low-noise bipolar Magnet or Diode Power supplies for the most demanding applications: particle accelerators, reliability test of noise-sensitive laser diodes…
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BE4082 – 4 isolated 6½ digit Voltmeters
BE4082 is designed to measure voltages. Used both: in labs thanks to its compact solution with its 4 precise voltage measurements in a single module, and in electronic component reliability test benches.
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BE4282 – Temperature – Frequency – Voltage measurement
BE4282 is ideal for: electronic component testing to make temperature measurements of the components under test and an auxiliary measurement either in voltage or in frequency (e.g. to measure the vibrator vibration frequency)
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BE516 – Multirange Voltage Source ±20V ±6A
BE516 is a multi-range voltage source, particularly well suited for creating test benches for electronic components. These numerous ranges make it possible to cover a wide range of applications. It’s positioned as a low cost solution allowing precise current measurements (a few µA to 6A)
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BE517 – Voltage Source +120V 4A
BE517 is a multi-range voltage source, particularly well suited for creating test benches for electronic components. These numerous ranges make it possible to cover a wide range of uses. It’s positioned as a low cost solution allowing precise current measurements (a few µA to 4A)
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BE5391 – Voltage Source: +1,5kV 10mA, 3 output channels
BE5391 is a general purpose high voltage source, which is particulary suitable to perform reliability test (e.g. HTRB) of high voltage transistors (e.g. SiC or GaN).
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BE547 – Voltage Source: +15V 12A
Its a general purpose which is perfect for reliability testing of high current and low voltage electronic components.